NEI-AOI Equipment

The NITE NEI-AOI is an automatic optical inspection equipment developed by NITE, featuring foreign object detection and foreign matter layering arbitration functions. In addition to traditional AOI detection for foreign objects, bubbles, bright spots, dark spots, bright lines, dark lines, unlit pixels, abnormal displays, GDS, Mura, and other defects, it is equipped with a foreign object recheck station. Using the small-field-of-view layered positioning imaging principle, the system classifies and processes defect layers in pixel layer images, distinguishing between defect categories such as foreign objects, dead pixels, gray layers, and others.
tel：027-63495836
email：sales@whnite.com
Technical Parameter Equipment technology advantages More Products

●Substrate Size：OLED/LCD full-size panels
●Defect Detection Size：Visible defect detection and classification corresponding to a single subpixel
●Missed Detection Rate：Missed detection ≤ 0.1%; False detection ≤ 5%
●Supported Product Resolution：4K and above
●Recheck Layering Function：Distinguishes defects in pixel layers, panels, POL, CG, and other layers
●Automation Functions：Automatic WD (working distance), automatic focus, automatic exposure, image quality analysis
●Irregular Shape Detection：Supports simultaneous testing of various irregular panels